The Java software, java-STM-AFM, creates visual representations of the experimental and theoretical data collected from scanning tunneling microscopy (STM) and atomic force microscopy (AFM) techniques.
With this software, you can create high-quality images that help visualize the samples at a granular level, providing valuable information for researchers. The program utilizes advanced algorithms to achieve unparalleled accuracy in the data displayed, giving you access to a comprehensive view of the samples while minimizing errors.
One of the significant advantages of Java-STM-AFM is its simple interface, which makes it accessible for users with different levels of expertise. It also provides multiple options for customizing the display of data, enabling you to enhance your findings and improve the overall user experience.
In conclusion, if you are involved in STM and AFM research and require a tool that can display both theoretical and experimental data with ease and accuracy, Java-STM-AFM is an excellent software option to consider.
Version 6.3: N/A